
Key highlights
The Texas Instruments AFE11612-SEP is an integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems.
It includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.
The AFE11612-SEP has an advanced integration, which significantly reduces component count and simplifies closed-loop system design. This makes the product suitable for space and satellite applications.
Applications
- Command and data handling (C&DH)
- Communications payload
- Radar imaging payload
- Optical imaging payload
- General analog monitoring and control
Key features
- Radiation tolerant:
- Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg at 125°C
- Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg
- Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
- Space-enhanced plastic (space EP):
- Meets ASTM E595 outgassing specification
- Vendor item drawing (VID) V62/22614
- One fabrication, assembly, and test site
- Gold bond wire, NiPdAu lead finish
- Wafer lot traceability
- Extended product life cycle
- Extended product change notification
- 8 GPIO pins:
- Internal 2.5-V reference
- Two remote temperature sensors
- Internal temperature sensor
- Configurable SPI and I2C interface
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Last updated: 2024-07-01
AFE11612-SEP - Radiation-tolerant 12-bit analog front end with temperature sensors and 12 DAC and 16 ADC channels

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