EEE > Power management > eFuse > Radiation-hardness-assured (RHA), 1.5-V to 7-V input, 6-A load switch and eFuse
Summary
The Texas Instrument TPS7H2201-SP is a single channel load switch radiation hardened and suitable for space satellite power management and distribution.
With a programmable slew rate, configurable rise time is provided by the component to minimize the reverse current protection and inrush current.
The component features a P-Channel MOSFET capable operating over a range of input voltage. An on and off input (EN) controls the switch that interfaces directly with the low-voltage control signals.
The integrated thermal pad with the ceramic package of the component allows high power dissipation.
Applications
- Space satellite power management and distribution
- Radiation hardened and tolerant power tree applications
- Available in military (–55°C to 125°C) temperature range
Orderable Part Numbers
- 5962-1422801VXC
- 5962R1722001V9A
- 5962R1722001VXC
- TPS7H2201HKR/EM
Key features
- Radiation performance:
- Radiation hardness assurance (RHA) up to TID 100 krad(Si)
- Single event latchup (SEL), single event burnout (SEB), and single event gate rupture (SEGR) immune to LET=75 MeV-cm2/mg
- SEFI/SET characterized to
LET=75 MeV-cm2/mg - Integrated single channel load switch
- Input voltage range: 1.5 V to 7 V
- Low on-resistance (RON) of 35-mΩ maximum at 25°C and VIN=5 V
- 6-A maximum continuous switch current
- Low control input threshold enables use of
1.2-, 1.8-, 2.5-, and 3.3-V logic - Configurable rise time (soft start)
- Reverse current protection
- Programmable and internal current limiting
(fast-trip) - Programmable fault timer (current limit and
retry modes) - Thermal shutdown
- Ceramic package with thermal pad
Reference designs
- TIDA-070001 - 3- to 7-VIN, Space-grade point-of-load (POL) reference design with redundant eFuse inputs for OCP
Testing & qualification
Below are the technical documentations available for this product:
- Radiation & reliability report
- Single-Event Effects Test Report of the TPS7H2201-SP Load Switch (Rev. A)
- TPS7H2201-SP Total Ionizing Dose (TID) Report (Rev. B)
- TPS7H2201-SP Neutron Displacement Damage Characterization
- Application note
- Failure Containment in Spacecraft Point-of-Load Power Supplies
- Single-Event Effects Confidence Interval Calculations
- Heavy Ion Orbital Environment Single-Event Effects Estimations
- Selection guide
- Technical article
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Last updated: 2021-12-21
TPS7H2201-SP
Radiation-hardness-assured (RHA), 1.5-V to 7-V input, 6-A load switch and eFuse
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